Flicker noise measurement of HF quartz resonators

被引：43

作者：

Rubiola, E ^{[1
]}

Groslambert, J

Brunet, M

Giordano, V

机构：

[1] Politecn Torino, I-10129 Turin, Italy

[2] Lab Phys & Metrol Oscillateurs, F-25044 Besancon, France

[3] Ctr Natl Etud Spatiales, F-31055 Toulouse, France

来源：

IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL | 2000年 / 47卷 / 02期

关键词：

Frequency stability - Quartz applications - Signal noise measurement;

D O I：

10.1109/58.827421

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

The frequency flicker of quartz resonators can be derived from the measurement of S phi(f), i.e., the power spectrum density of phase fluctuations phi. The interferometric method appears to be the best choice to measure the phase fluctuations of the quartz, resonators because of its high sensitivity in the low power conditions, which is required for this type of resonator. Combining these two ideas, we built an instrument suitable to measure the frequency flicker floor of the quartz resonators, and we measured the stability of some 10-MHz high performance resonators as a function of the dissipated power. The stability limit of our instrument, described in terms of Allan deviation sigma(y)(tau), is of some 10(-14).

引用

页码：361 / 368

页数：8

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