X-ray resonant single-crystal diffraction technique, a powerful tool to investigate the kesterite structure of the photovoltaic Cu2ZnSnS4 compound

被引：57

作者：

Lafond, Alain ^{[1
]}

Choubrac, Leo ^{[1
]}

Guillot-Deudon, Catherine ^{[1
]}

Fertey, Pierre ^{[2
]}

Evain, Michel ^{[1
]}

Jobic, Stephane ^{[1
]}

机构：

[1] Univ Nantes, CNRS, Inst Mat Jean Rouxel IMN, F-44322 Nantes 03, France

[2] Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France

来源：

ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS | 2014年 / 70卷

关键词：

OPTICAL-PROPERTIES; RAMAN-SCATTERING; GEMINOGRAPHY; STANNITE;

D O I：

10.1107/S2052520614003138

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Cu/Zn disorder in the kesterite Cu2ZnSnS4 derivatives used for thin film based solar cells is an important issue for photovoltaic performances. Unfortunately, Cu and Zn cannot be distinguished by conventional laboratory X-ray diffraction. This paper reports on a resonant diffraction investigation of a Cu2ZnSnS4 single crystal from a quenched powdered sample. The full disorder of Cu and Zn in the z = 1/4 atomic plane is shown. The structure, namely disordered kesterite, is then described in the I (4) over bar 2m space group.

引用

页码：390 / 394

页数：5

共 22 条

[1]

[Anonymous], 2013, CRYSALIS PRO

[2]

BERNARDINI GP, 1990, EUR J MINERAL, V2, P219

[3] Intrinsic point defects and complexes in the quaternary kesterite semiconductor Cu2ZnSnS4 [J].