Focal plane metrology for the LSST camera

被引:5
作者
Rasmussen, Andrew P. [1 ]
Hale, Layton [2 ]
Kim, Peter [1 ]
Lee, Eric [1 ]
Perl, Martin [1 ]
Schindler, Rafe [1 ]
Takacs, Peter [3 ]
Thurston, Timothy [1 ]
机构
[1] Stanford Linear Accelerator Ctr, 2575 Sand Hill Rd, Menlo Pk, CA 94025 USA
[2] Innovat Machine Solut, Dublin, CA 94568 USA
[3] Brookhaven Natl Lab, Upton, NY 11973 USA
来源
OPTOMECHANICAL TECHNOLOGIES FOR ASTRONOMY, PTS 1 AND 2 | 2006年 / 6273卷
基金
美国国家科学基金会;
关键词
telescopes; LSST; wide field imaging; sensor array; focal plane; flatness; metrology; finite element metrology; stitching algorithms;
D O I
10.1117/12.673210
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Meeting the science goals for the Large Synoptic Survey Telescope (LSST) translates into a demanding set of imaging performance requirements for the optical system over a wide (3.5 degrees) field of view. In turn, meeting those imaging requirements necessitates maintaining precise control of the focal plane surface (10 pm P-V) over the entire field of view (640 mm diameter) at the operating temperature (T similar to -100 degrees C) and over the operational elevation angle range. We briefly describe the heirarchical design approach for the LSST Camera focal plane and the baseline design for assembling the flat focal plane at room temperature. Preliminary results of gravity load and thermal distortion calculations are provided, and early metrological verification of candidate materials under cold thermal conditions are presented. A detailed, generalized method for stitching together sparse metrology data originating from differential, non-contact metrological data acquisition spanning multiple (non-continuous) sensor surfaces making up the focal plane, is described and demonstrated. Finally, we describe some in situ alignment verification alternatives, some of which may be integrated into the camera's focal plane.
引用
收藏
页数:13
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