A Residual Storage Life Prediction Approach for Systems With Operation State Switches

被引:69
作者
Si, Xiao-Sheng [1 ,2 ]
Hu, Chang-Hua [1 ]
Kong, Xiangyu [1 ]
Zhou, Dong-Hua [3 ]
机构
[1] Xian Inst High Tech, Dept Automat, Xian 710025, Peoples R China
[2] Tsinghua Univ, Dept Automat, Beijing 100084, Peoples R China
[3] Tsinghua Univ, TNList, Dept Automat, Beijing 100084, Peoples R China
基金
中国国家自然科学基金;
关键词
Bayesian method; condition monitoring (CM); degradation; gyroscope; lifetime estimation; Markov process; parameter estimation; prediction method; prognostics and health management; BURN-IN; DEGRADATION; PROGNOSTICS; CHARGE; HEALTH;
D O I
10.1109/TIE.2014.2308135
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper concerns the problem of predicting residual storage life for a class of highly critical systems with operation state switches between the working state and storage state. A success of estimating the residual storage life for such systems depends heavily on incorporating their two main characteristics: 1) system operation process could experience a number of state transitions between the working state and storage state; and 2) system's degradation depends on its operation states. Toward this end, we present a novel degradation model to account for the dependency of the degradation process on the system's operation states, where a two-state continuous-time homogeneous Markov process is used to approximate the switches between the working state and storage state. Using the monitored degradation data during the working state and the available system operation information, the parameters in the presented model can be estimated/updated under Bayesian paradigm. Then, the posterior probabilistic law of the number of state transitions and their transition times are derived, and further, the formulation for the predicted residual storage life distribution is established by considering the possible state transitions in the future. To be solvable, a numerical solution algorithm is provided to calculate the distribution of the predicted residual storage life. Finally, we demonstrate the proposed approach by a case study for gyroscopes.
引用
收藏
页码:6304 / 6315
页数:12
相关论文
共 26 条
[1]   A change-point analysis for modeling incomplete burn-in for light displays [J].
Bae, SJ ;
Kvam, PH .
IIE TRANSACTIONS, 2006, 38 (06) :489-498
[2]   Condition monitoring and remaining useful life prediction using degradation signals: revisited [J].
Chen, Nan ;
Tsui, Kwok Leung .
IIE TRANSACTIONS, 2013, 45 (09) :939-952
[3]  
Cinlar E., 1987, Probability in the Engineering and Information Sciences, V1, P97, DOI [DOI 10.1017/S0269964800000322, 10.1017/S0269964800000322]
[4]  
Cox D., 2017, The theory of stochastic processes
[5]   Storage Life Prediction for a High-Performance Capacitor Using Multi-Phase Wiener Degradation Model [J].
Feng, Jing ;
Sun, Quan ;
Jin, Tongdan .
COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION, 2012, 41 (08) :1317-1335
[6]   Prognostic Degradation Models for Computing and Updating Residual Life Distributions in a Time-Varying Environment [J].
Gebraeel, Nagi ;
Pan, Jing .
IEEE TRANSACTIONS ON RELIABILITY, 2008, 57 (04) :539-550
[7]   Estimation of State of Charge, Unknown Nonlinearities, and State of Health of a Lithium-Ion Battery Based on a Comprehensive Unobservable Model [J].
Gholizadeh, Mehdi ;
Salmasi, Farzad R. .
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2014, 61 (03) :1335-1344
[8]  
Hawkes A. G., 2012, IIE T, V43, P761
[9]   Prognostics of lithium-ion batteries based on Dempster-Shafer theory and the Bayesian Monte Carlo method [J].
He, Wei ;
Williard, Nicholas ;
Osterman, Michael ;
Pecht, Michael .
JOURNAL OF POWER SOURCES, 2011, 196 (23) :10314-10321
[10]   Threshold regression for survival analysis: Modeling event times by a stochastic process reaching a boundary [J].
Lee, Mei-Ling Ting ;
Whitmore, G. A. .
STATISTICAL SCIENCE, 2006, 21 (04) :501-513