Improved background-fitting algorithms for ionization edges in electron energy-loss spectra

被引：37
作者：
Egerton, RF [1 ]
Malac, M [1 ]
机构：
[1] Univ Alberta, Dept Phys, Fac Sci, Edmonton, AB T6G 2J1, Canada
来源：
ULTRAMICROSCOPY | 2002年 / 92卷 / 02期
关键词：
electron energy-loss spectroscopy (EELS); elemental analysis; background fitting;
D O I：
10.1016/S0304-3991(01)00155-3
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We discuss improved procedures for fitting a power-law background to an ionization edge in an electron energy-loss spectrum. They place constraints on the background, both above and below the ionization-threshold energy, and are of particular advantage in the case of weak edges arising from low elemental concentrations. The algorithms are currently implemented as short Calculator programs for Galan EL/P software. Their advantages and limitations are discussed, in comparison with multiple-least-squares and spatial-difference techniques. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：47 / 56
页数：10
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