Structural paradigm of Se-rich Ge-Se glasses by high-resolution x-ray photoelectron spectroscopy

被引：51

作者：

Golovchak, R. ^{[1
,2
]}

Shpotyuk, O. ^{[1
,3
]}

Kozyukhin, S. ^{[4
]}

Kovalskiy, A. ^{[2
]}

Miller, A. C. ^{[2
]}

Jain, H. ^{[2
]}

机构：

[1] Lviv Sci Res Inst Mat SRC Carat, UA-79031 Lvov, Ukraine

[2] Lehigh Univ, Dept Mat Sci & Engn, Bethlehem, PA 18015 USA

[3] Jan Dlugosz Univ, Inst Phys, PL-42201 Czestochowa, Poland

[4] RAS, Inst Gen & Inorgan Chem, Moscow 199991, Russia

来源：

JOURNAL OF APPLIED PHYSICS | 2009年 / 105卷 / 10期

基金：

美国国家科学基金会; 俄罗斯基础研究基金会;

关键词：

chalcogenide glasses; germanium compounds; glass structure; X-ray photoelectron spectra; SHORT-RANGE ORDER; CHALCOGENIDE; ORGANIZATION; RIGIDITY;

D O I：

10.1063/1.3130608

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The structure of binary GexSe100-x chalcogenide glass family (0 <= x <= 30) is determined by high-resolution x-ray photoelectron spectroscopy (XPS). On the basis of compositional dependences of fitting parameters for Ge and Se core level XPS spectra, the ratio between edge- and corner-shared tetrahedra is determined. We find that this ratio for glasses with 20 <= x <= 30 is almost constant with a value same as for the high-temperature crystalline form of GeSe2.

引用

页数：7

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