Fourier plane imaging microscopy

被引：28

作者：

Dominguez, Daniel ^{[1
,2
]}

Alharbi, Nouf ^{[1
]}

Alhusain, Mdhaoui ^{[1
]}

Bernussi, Ayrton A. ^{[2
,3
]}

de Peralta, Luis Grave ^{[1
,2
]}

机构：

[1] Texas Tech Univ, Dept Phys, Lubbock, TX 79409 USA

[2] Texas Tech Univ, Nano Tech Ctr, Lubbock, TX 79409 USA

[3] Texas Tech Univ, Dept Elect & Comp Engn, Lubbock, TX 79409 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2014年 / 116卷 / 10期

基金：

美国国家科学基金会;

关键词：

WIDE-FIELD; RESOLUTION;

D O I：

10.1063/1.4895157

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We show how the image of an unresolved photonic crystal can be reconstructed using a single Fourier plane ( FP) image obtained with a second camera that was added to a traditional compound microscope. We discuss how Fourier plane imaging microscopy is an application of a remarkable property of the obtained FP images: they contain more information about the photonic crystals than the images recorded by the camera commonly placed at the real plane of the microscope. We argue that the experimental results support the hypothesis that surface waves, contributing to enhanced resolution abilities, were optically excited in the studied photonic crystals. (C) 2014 AIP Publishing LLC.

引用

页数：7

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