Sensitive method for measuring third order nonlinearities in compact dielectric and hybrid plasmonic waveguides

被引：22

作者：

Diaz, F. J. ^{[1
]}

Hatakeyama, T. ^{[3
]}

Rho, J. ^{[3
]}

Wang, Y. ^{[3
]}

O'Brien, K. ^{[3
]}

Zhang, X. ^{[3
,4
]}

de Sterke, C. Martijn ^{[1
,2
]}

Kuhlmey, B. T. ^{[1
,2
]}

Palomba, S. ^{[1
]}

机构：

[1] Univ Sydney, Sch Phys, IPOS, Sydney, NSW 2006, Australia

[2] Ctr Ultrahigh Bandwidth Devices Opt Syst Cudos, Camperdown, NSW, Australia

[3] Univ Calif Berkeley, NSF Nanoscale Sci & Engn Ctr NSEC, Berkeley, CA 94720 USA

[4] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Div Mat Sci, Berkeley, CA 94720 USA

来源：

OPTICS EXPRESS | 2016年 / 24卷 / 01期

基金：

澳大利亚研究理事会;

关键词：

SUBWAVELENGTH LIGHT CONFINEMENT; SELF-PHASE-MODULATION; PROPAGATION; ENHANCEMENT; MICROSCOPY; WEDGES; MODES; SCALE;

D O I：

10.1364/OE.24.000545

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate a sensitive method for the nonlinear optical characterization of micrometer long waveguides, and apply it to typical silicon-on-insulator nanowires and to hybrid plasmonic waveguides. We demonstrate that our method can detect extremely small nonlinear phase shifts, as low as 7.5.10(-4) rad. The high sensitivity achieved imparts an advantage when investigating the nonlinear behavior of metallic structures as their short propagation distances complicates the task for conventional methods. Our results constitute the first experimental observation of chi((3)) nonlinearities in the hybrid plasmonic platform and is important to test claims of hybrid plasmonic structures as candidates for efficient nonlinear optical devices. (C) 2016 Optical Society of America

引用

页码：545 / 554

页数：10

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