Displacement measuring grating interferometer: a review

被引:96
作者
Hu, Peng-cheng [1 ,2 ]
Chang, Di [1 ,2 ]
Tan, Jiu-bin [1 ,2 ]
Yang, Rui-tao [1 ,2 ]
Yang, Hong-xing [1 ,2 ]
Fu, Hai-jin [1 ,2 ]
机构
[1] Harbin Inst Technol, Ctr Ultra Precis Optoelect Instrument Engn, Harbin 150080, Heilongjiang, Peoples R China
[2] Minist Ind & Informat Technol, Key Lab Ultra Precis Intelligent Instrumentat, Harbin 150080, Heilongjiang, Peoples R China
基金
中国国家自然科学基金;
关键词
Grating interferometer; Optical encoder; Displacement measurement; Precision measurement; LASER LINEAR ENCODER; HIGH-RESOLUTION; 6-DEGREE-OF-FREEDOM DISPLACEMENT; SURFACE ENCODER; DIMENSIONAL METROLOGY; MEASUREMENT SYSTEM; OPTICAL METHODS; HIGH TOLERANCE; WAFER STAGE; ERROR;
D O I
10.1631/FITEE.1800708
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
A grating interferometer, called the optical encoder, is a commonly used tool for precise displacement measurements. In contrast to a laser interferometer, a grating interferometer is insensitive to the air refractive index and can be easily applied to multi-degree-of-freedom measurements, which has made it an extensively researched and widely used device. Classified based on the measuring principle and optical configuration, a grating interferometer experiences three distinct stages of development: homodyne, heterodyne, and spatially separated heterodyne. Compared with the former two, the spatially separated heterodyne grating interferometer could achieve a better resolution with a feature of eliminating periodic nonlinear errors. Meanwhile, numerous structures of grating interferometers with a high optical fold factor, a large measurement range, good usability, and multi-degree-of-freedom measurements have been investigated. The development of incremental displacement measuring grating interferometers achieved in recent years is summarized in detail, and studies on error analysis of a grating interferometer are briefly introduced.
引用
收藏
页码:631 / 654
页数:24
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