Radiated spurious emission measurements using fast Fourier transform-based time domain scan

被引:0
|
作者
Sim, Zhi Wei [1 ]
Song, Jian [2 ]
机构
[1] Rohde & Schwarz Asia Pte Ltd, Singapore, Singapore
[2] Natl Univ Singapore, Singapore 117548, Singapore
关键词
radiation detection; fast Fourier transforms; time-domain analysis; radiated spurious emission measurement; fast Fourier transform; time domain scan; TD scan; RSE measurement; time measurement; frequency sweep method; wireless technology; GSM; 900; 1800; MEASUREMENT SYSTEM;
D O I
10.1049/iet-smt.2014.0333
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, the use of time domain (TD) scan based on fast Fourier transform technique for radiated spurious emission (RSE) measurements is investigated. Measurement time and results of TD scan are compared with those of conventional frequency sweep method. The RSE measurements carried out are based on two different wireless technologies, that is, GSM 900 and GSM 1800. The findings show that the TD scan can reduce overall RSE test time up to 86% with comparable measurement results.
引用
收藏
页码:882 / 889
页数:8
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