共 8 条
[1]
Simulation of charge breeding for trapped ions
[J].
HCI 2006: 13TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF HIGHLY CHARGED IONS,
2007, 58
:443-+
[2]
DONETS DE, 1996, Patent No. 2067784
[3]
Donets E. D., 2003, Patent RU, Patent No. 2205467
[4]
Electron string phenomenon: Physics and use
[J].
Ninth International Symposium on Electron Beam Ion Sources and Traps and Their Applications,
2004, 2
:213-219
[7]
DONETS ED, 1984, Patent No. 1225420
[8]
Theory and simulation of a tubular EBIS
[J].
Ninth International Symposium on Electron Beam Ion Sources and Traps and Their Applications,
2004, 2
:97-106