How does crystalline substrate plasticity modify thin film buckling?

被引：29

作者：

Foucher, Frederic ^{[1
]}

Coupeau, Christophe ^{[1
]}

Colin, Jerome ^{[1
]}

Cimetiere, Alain ^{[1
]}

Grilhe, Jean ^{[1
]}

机构：

[1] Univ Poitiers, Met Phys Lab, F-86962 Futuroscope, France

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 97卷 / 09期

关键词：

D O I：

10.1103/PhysRevLett.97.096101

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report experimental atomic force microscopy observations and analytical modeling of buckling structures of thin films deposited on single crystal substrates. The formation of straight-sided blisters just above the step structures resulting from the dislocations emergence has been observed and explained in the framework of the Foppl-von Karman theory of thin plates. A critical step height above which the buckling may occur has been determined and the asymmetry of the resulting blisters has been explained. Finally, the new buckling criterion has been compared with the classical one in the plane case and allows us to explain the blisters localization on step structures.

引用

页数：4

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