共 24 条
- [4] TUNGSTEN NITRIDE THIN-FILMS PREPARED BY MOCVD [J]. JOURNAL OF MATERIALS RESEARCH, 1993, 8 (06) : 1353 - 1360
- [5] Eckstein Wolfgang., 2002, Calculated Sputtering, Reflection and Range Values, P1
- [9] Interface chemistry of WN/4H-SiC structures [J]. APPLIED SURFACE SCIENCE, 1999, 151 (3-4) : 225 - 232