Hydrogen diffusion and chemical reactivity with water on nearly ideally H-terminated Si(100) surface

被引:4
作者
Wang, ZH [1 ]
Noda, H
Nonogaki, Y
Yabumoto, N
Urisu, T
机构
[1] Grad Univ Adv Studies, Inst Mol Sci, Okazaki, Aichi 4448585, Japan
[2] Hitachi Ltd, Cent Res Lab, Kobubunji 1858601, Japan
[3] Inst Mol Sci, Dept Vacuum UV Photosci, Okazaki, Aichi 4448585, Japan
[4] NTT Corp, Adv Technol Corp, Atsugi, Kanagawa 2430124, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2002年 / 41卷 / 6B期
关键词
silicon; hydrogen atom; deuterium atom; hydrogen termination; hydrogen diffusion; IRRAS; water;
D O I
10.1143/JJAP.41.4275
中图分类号
O59 [应用物理学];
学科分类号
摘要
A nearly ideally H-terminated condition for a Si(100) 2 x I surface is determined from the dependence of the peak intensity and the linewidth of the coupled monohydride symmetric stretching vibration on the hydrogen exposure and exposure temperature, which has been investigated with infrared reflection absorption spectroscopy (IRRAS) using CoSi2 buried metal layer substrate. Even for nearly ideally H-terminated surfaces, the linewidth significantly changes depending on the hydrogen exposure and the exposure temperature. The concentration of deuterium atoms incorporated in the Si bulk is measured by temperature programmed desorption, and it is concluded that hydrogen diffusion into the subsurface of Si has a significant influence on the linewidth broadening. The chemical reactivity with water on the H-terminated Si surface is also investigated.
引用
收藏
页码:4275 / 4278
页数:4
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