A Systemic Approach to Exploring an Essential Patent Linking Standard and Patent Maps: Application of Generative Topographic Mapping (GTM)

被引:21
作者
Jeong, Seonkoo [1 ]
Yoon, Byungun [2 ]
机构
[1] Dongguk Univ, Seoul, South Korea
[2] Dongguk Univ, Dept Ind & Syst Engn, Seoul, South Korea
来源
EMJ-ENGINEERING MANAGEMENT JOURNAL | 2013年 / 25卷 / 01期
基金
新加坡国家研究基金会;
关键词
Essential Patent; GTM; Standard Map; Patent Map; Information Visualization; VISUALIZATION; TECHNOLOGY;
D O I
10.1080/10429247.2013.11431965
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
As the intense competition for the international standardization of technology has increased, many companies are concentrating their capabilities on securing essential patents that claim one or more inventions required to practice a given industry standard; however, despite the importance of developing essential patents, the approaches to exploring promising essential patents have some limitations in terms of methodology and data. As a remedy, this article proposes a method that derives an essential patent through Generative Topographic Mapping (GTM)-based standard and patent maps. The suggested approach involves a systematic process that identifies vacuums on a standard map in a specific technology field and enables analysts to find candidates for promising essential patents instead of relying on the experts. By applying the proposed methodology, this research discovered the vacuums in an industrial standard document about fuel cell technology as well as the candidates of essential patents in this technology field.
引用
收藏
页码:48 / 57
页数:10
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