Nanopillar-forest based surface-enhanced Raman scattering substrates

被引:3
作者
Bao AiDa [1 ,3 ]
Mao HaiYang [1 ,2 ]
Xiong JiJun [1 ]
Chen ZhuoJie [4 ]
Ou Wen [2 ]
Chen DaPeng [2 ]
机构
[1] North Univ China, MOE Key Lab Instrumentat Sci & Dynam Measurement, Taiyuan 030051, Peoples R China
[2] Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices Integrated Technol, Beijing 100029, Peoples R China
[3] Beijing Inst Technol, Sch Informat & Elect, Beijing 100081, Peoples R China
[4] Peking Univ, Inst Microelect, Natl Key Lab Sci & Technol Micro Nano Fabricat, Beijing 100871, Peoples R China
基金
中国国家自然科学基金;
关键词
surface-enhanced Raman scattering (SERS); nanopillar forests; sidewall technology; Poly-Si films; electromagnetic field distributions; SERS;
D O I
10.1007/s11432-014-5114-8
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this work, nanopillar-forest based surface-enhanced Raman scattering substrates were fabricated using a novel approach. The key technique of the approach is taking advantage of convexes on Poly-Si surfaces as support structures in sidewall technology. The tip-diameters of the fabricated nanopillars are from 5 to 10 nm, heights are of several microns, and density of the nanopillar-based forests is around 20/mu m(2). In these nanopillar forests, there are plenty of nanoscale gaps. When covered with a thin layer of noble metal, the nanopillar forests exhibit a high SERS-active capability. Primary measurement results demonstrate that the nanopillar-forest based SERS substrates have an enhancement factor of an order of 4.62 x 10(6). It is expected that such SERS substrates may have applications in biological monitoring and chemical detection.
引用
收藏
页码:1 / 7
页数:8
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