Preparing for high-repetition rate hard x-ray self-seeding at the European X-ray Free Electron Laser: Challenges and opportunities

被引：24

作者：

Liu, Shan ^{[1
]}

Decking, Winfried ^{[1
]}

Kocharyan, Vitali ^{[1
]}

Saldin, Evgeni ^{[1
]}

Serkez, Svitozar ^{[2
]}

Shayduk, Roman ^{[2
]}

Sinn, Harald ^{[2
]}

Geloni, Gianluca ^{[2
]}

机构：

[1] DESY, Hamburg, Germany

[2] European XFEL GmbH, Hamburg, Germany

来源：

PHYSICAL REVIEW ACCELERATORS AND BEAMS | 2019年 / 22卷 / 06期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1103/PhysRevAccelBeams.22.060704

中图分类号：

O57 [原子核物理学、高能物理学];

学科分类号：

070202 ;

摘要：

A hard x-ray self-seeding (HXRSS) setup will soon be available at the European X-ray Free Electron Laser (XFEL). The availability of high repetition rate x-ray pulses poses novel challenges in the setup development, compared to the choices made at other facilities, mainly crystal heat-load and radiation-damage issues. However, high-repetition rate is expected to allow for unprecedented output characteristics. A two-chicane HXRSS setup is found to be optimal for the European XFEL. In this paper we discuss the physical choices peculiar to that facility and simulations done, which allow us to fix the parameter for the setup design.

引用

收藏

页数：14

相关论文

共 26 条

[1] OCELOT: A software framework for synchrotron light source and FEL studies [J].

Agapov, I. ;

Geloni, G. ;

Tomin, S. ;

Zagorodnov, I. .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2014, 768 :151-156

[2]

Amann J, 2012, NAT PHOTONICS, V6, P693, DOI [10.1038/NPHOTON.2012.180, 10.1038/nphoton.2012.180]

[3] Ultra-high-resolution inelastic X-ray scattering at high-repetition-rate self-seeded X-ray free-electron lasers [J].

Chubar, Oleg ;

Geloni, Gianluca ;

Kocharyan, Vitali ;

Madsen, Anders ;

Saldin, Evgeni ;

Serkez, Svitozar ;

Shvyd'ko, Yuri ;

Sutter, John .

JOURNAL OF SYNCHROTRON RADIATION, 2016, 23 :410-424

[4]

Csonka P. L., 1978, Particle Accelerators, V8, P225

[5] Thermoelastic analysis of a silicon surface under x-ray free-electron-laser irradiation (vol 81, 073102, 2010) [J].

de Castro, A. R. B. ;

Vasconcellos, Aurea R. ;

Luzzi, Roberto .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (04)

[6] Thermoelastic analysis of a silicon surface under x-ray free-electron-laser irradiation [J].

de Castro, A. R. B. ;

Vasconcellos, Aurea R. ;

Luzzi, Roberto .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (07)

[7] Femtosecond X-Ray Pulse Characterization in Free-Electron Lasers Using a Cross-Correlation Technique [J].

Ding, Y. ;

Decker, F. -J. ;

Emma, P. ;

Feng, C. ;

Field, C. ;

Frisch, J. ;

Huang, Z. ;

Krzywinski, J. ;

Loos, H. ;

Welch, J. ;

Wu, J. ;

Zhou, F. .

PHYSICAL REVIEW LETTERS, 2012, 109 (25)

[8] Possible application of X-ray optical elements for reducing the spectral bandwidth of an X-ray SASE FEL [J].

Feldhaus, J ;

Saldin, EL ;

Schneider, JR ;

Schneidmiller, EA ;

Yurkov, MV .

OPTICS COMMUNICATIONS, 1997, 140 (4-6) :341-352

[9] Time-resolved investigation of nanometer scale deformations induced by a high flux x-ray beam [J].

Gaudin, J. ;

Keitel, B. ;

Jurgilaitis, A. ;

Nuske, R. ;

Guerin, L. ;

Larsson, J. ;

Mann, K. ;

Schaefer, B. ;

Tiedtke, K. ;

Trapp, A. ;

Tschentscher, Th ;

Yang, F. ;

Wulff, M. ;

Sinn, H. ;

Floeter, B. .

OPTICS EXPRESS, 2011, 19 (16) :15516-15524

[10]

Geloni G., ARXIV13017621