The testing of the sample-and-hold amplifier's feedthrough

被引：0

作者：

Liao, SJ ^{[1
]}

Gong, JP ^{[1
]}

Tan, YB ^{[1
]}

Chen, GJ ^{[1
]}

机构：

[1] Taiyuan Univ Technol, Taiyuan 030024, Shanxi, Peoples R China

来源：

ICEMI'2001: FIFTH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT AND INSTRUMENTS, VOL 1, CONFERENCE PROCEEDINGS | 2001年

关键词：

Sample-and-hold Amplifier; correlative sampling; dynamic characteristic; dynamic testing;

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

Many analog-to-digital converter(ADC) which aimed at sampling data, must be connected a Sample-and-hold Amplifier (SHA) in front of the ADC. Such arrangement improved the dynamic performance of ADC. It is necessarily to test the key specification of SHA's hold stage, such as feedthrough. The test of above specification realized in Synchro 11 mixed signal circuit test system is present in this paper. For the highspeed SHA, the method of correlative sampling has been utilized to get a good result.

引用

页码：244 / 247

页数：4