Determination of optical constants of thin films from transmittance trace

被引：54

作者：

Bhattacharyya, S. R. ^{[1
]}

Gayen, R. N. ^{[1
]}

Paul, R. ^{[1
]}

Pal, A. K. ^{[1
]}

机构：

[1] Jadavpur Univ, Dept Instrumentat Sci, Kolkata 700032, W Bengal, India

来源：

THIN SOLID FILMS | 2009年 / 517卷 / 18期

关键词：

Optical constants; Transmittance; AMORPHOUS-SILICON; REFRACTIVE-INDEX; ALLOY-FILMS; ZNO FILMS; SUBSTRATE; THICKNESS; GROWTH; SEMICONDUCTORS; BANDGAP; GAP;

D O I：

10.1016/j.tsf.2009.03.168

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A simple method is depicted in this communication to determine the optical constants of transparent thin films from transmittance versus wavelength traces, showing no fringes, for evaluating thickness. The strength of this technique is apparent when applied to Zn1-xMgxO films. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：5530 / 5536

页数：7

共 30 条

[1] BANDGAP AND OPTICAL-TRANSITIONS IN THIN-FILMS FROM REFLECTANCE MEASUREMENTS [J].

BHATTACHARYYA, D ;

CHAUDHURI, S ;

PAL, AK .

VACUUM, 1992, 43 (04) :313-316

[2] DETERMINATION OF REFRACTIVE-INDEX OF THIN-FILMS BEYOND THE ABSORPTION-EDGE [J].

BHATTACHARYYA, D ;

BHATTACHARYYA, SK ;

CHAUDHURI, S ;

PAL, AK .

VACUUM, 1993, 44 (10) :979-981

[3] DETERMINATION OF EFFECTIVE-MASS OF ELECTRONS IN TERNARY COMPOUND SEMICONDUCTORS [J].

BHATTACHARYYA, D ;

CHAUDHURI, S ;

PAL, AK .

VACUUM, 1995, 46 (01) :1-3

[4] Realization of band gap above 5.0 eV in metastable cubic-phase MgxZn1-xO alloy films [J].

Choopun, S ;

Vispute, RD ;

Yang, W ;

Sharma, RP ;

Venkatesan, T ;

Shen, H .

APPLIED PHYSICS LETTERS, 2002, 80 (09) :1529-1531

[5]

Ferry D.K., 1995, SEMICONDUCTORS

[6] OPTICAL DISPERSION-RELATIONS FOR AMORPHOUS-SEMICONDUCTORS AND AMORPHOUS DIELECTRICS [J].

FOROUHI, AR ;

BLOOMER, I .

PHYSICAL REVIEW B, 1986, 34 (10) :7018-7026

[7] Zinc magnesium oxide nanofibers on glass substrate by solution growth technique [J].

Gayen, R. N. ;

Das, S. N. ;

Dalui, S. ;

Bhar, R. ;

Pal, A. K. .

JOURNAL OF CRYSTAL GROWTH, 2008, 310 (18) :4073-4080

[8] Determination of optical constants (n, k, d) of very thin films deposited on absorbing substrate [J].

Gushterova, P ;

Sharlandjiev, P .

VACUUM, 2004, 76 (2-3) :185-189

[9] INTERFERENCE-FREE DETERMINATION OF THE OPTICAL-ABSORPTION COEFFICIENT AND THE OPTICAL GAP OF AMORPHOUS-SILICON THIN-FILMS [J].

HISHIKAWA, Y ;

NAKAMURA, N ;

TSUDA, S ;

NAKANO, S ;

KISHI, Y ;

KUWANO, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (05) :1008-1014

[10] Optical constants of transparent ZnO films by RF magnetron sputtering [J].

Huang, Bo ;

Li, Jing ;

Wu, Yue-bo ;

Guo, Dong-hui ;

Wu, Sun-tao .

MATERIALS LETTERS, 2008, 62 (8-9) :1316-1318

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