High-precision measurement of free spectral range of etalon

被引:13
|
作者
Gee, S. [1 ]
Ozharar, S. [1 ]
Quinlan, F. [1 ]
Delfyett, P. J. [1 ]
机构
[1] Univ Cent Florida, Coll Opt, Ctr Res & Educ Opt & Lasers, Orlando, FL 32816 USA
关键词
D O I
10.1049/el:20060652
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel measurement technique to determine the free spectral range of an etalon utilising a modified Pound-Drever-Hall technique is demonstrated with better than 1 part in 10(4) precision.
引用
收藏
页码:715 / 716
页数:2
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