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Vertical organic light-emitting transistors with an evaporated Al gate inserted between hole-transporting layers
被引:13
|作者:
Yang, Shengyi
[1
]
Du, Wenshu
[1
]
Qi, Jieru
[1
]
Lou, Zhidong
[1
]
机构:
[1] Beijing Jiaotong Univ, Key Lab Luminescence & Opt Informat, Minist Educ, Inst Optoelet Technol, Beijing 100044, Peoples R China
基金:
中国国家自然科学基金;
关键词:
Vertical organic light-emitting transistors (VOLETs);
Hole-transporting layers;
Static induction transistors (SITs);
FIELD-EFFECT TRANSISTOR;
DEVICE CHARACTERISTICS;
INJECTION;
FILMS;
D O I:
10.1016/j.jlumin.2009.04.064
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
Similar to the configuration of static induction transistor (SIT), vertical organic light-emitting transistors (VOLETs) with an evaporated Al gate inserted between hole-transporting layers were fabricated and their static characteristics were characterized. By using Alq(3) as the emissive layer. the basic transistor characteristics of the VOLETs were compared with two organic hole-transporting layers, N,N'-diphenyl-N.N'-bis(3-methylphenyl)-(1,1'-biphenyl)-4,4'-diamine (TPD) and N,N'-bis-(1-naphthyl)-N,N'-diphenyl-1,1'-biphenyl-4,4'-diamine (NPB) Our experimental data show that the intensity of emission from VOLETs can be tuned by adjusting gate voltages. The emission intensity of device ITO/TPD/Al/TPD/Alq(3)/Al decreases by increasing the applied gate voltages, showing an operation in depletion mode, however, it shows the operation in enhancement mode for VOLET device ITO/NPB/Al/NPB/Alq(3)/Al Further, the reasons for these two different phenomena were discussed in terms of the dielectric constant of materials. carrier mobility and energy barriers at electrode/organic interface. (C) 2009 Elsevier B V All rights reserved
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页码:1973 / 1977
页数:5
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