Evaluation of Encoding Schemas for Optimization of Bit-Level Run-Length Encoding Within Lossless Compression of Binary Images

被引:0
作者
Mados, Branislav [1 ]
Adam, Norbert [1 ]
机构
[1] Tech Univ Kosice, Fac Elect Engn & Informat, Dept Comp & Informat, Kosice, Slovakia
来源
2019 IEEE 23RD INTERNATIONAL CONFERENCE ON INTELLIGENT ENGINEERING SYSTEMS (INES 2019) | 2019年
关键词
data compression; lossless compression; run-length encoding; RLE; binary image; 3D binary image; computed tomography; CT; magnetic resonance imaging; MRI;
D O I
10.1109/ines46365.2019.9109528
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
The paper deals with the problematics of lossless data compression and is focused on the use of Run-Length Encoding (RLE) principle of lossless compression of binary images, especially binarized volume datasets that can be considered as the 3D binary images. Different alternative encoding schemas are proposed in the first part of this work for bit-level run-length encoding and capacities of their encoding words are discussed also with the focus on the encoding of long symbol runs. Test results of proposed encoding schemas using binarized volume datasets obtained by the medical imaging techniques including Computed Tomography (CT) and Magnetic Resonance Imaging (MRI) and the influence of the length of the encoding word to the compression rate of proposed encoding schemas are discussed in the second part of the paper.
引用
收藏
页码:75 / 80
页数:6
相关论文
共 26 条
[1]  
Akhter S, 2010, EUR SIGNAL PR CONF, P1645
[2]  
Alsenwi Madyan, 2017, 2017 29th International Conference on Microelectronics (ICM), DOI 10.1109/ICM.2017.8268880
[3]  
Alsenwi M, 2016, INT C MICROELECTRON, P1, DOI 10.1109/ICM.2016.7847849
[4]   Digital electronic control of a small turbojet engine -: MPM 20 [J].
Andoga, Rudolf ;
Madarasv, Ladislav ;
Fozo, Ladislav .
INES 2008: 12TH INTERNATIONAL CONFERENCE ON INTELLIGENT ENGINEERING SYSTEMS, PROCEEDINGS, 2008, :37-40
[5]  
Chouakri S. A., 2011, P 4 INT S APPL SCI B, DOI 10.1145/2093698.2093735
[6]  
Curless B., 1996, Computer Graphics Proceedings. SIGGRAPH '96, P303, DOI 10.1145/237170.237269
[7]  
Fozo L, 2016, INT SYMP COMP INTELL, P75, DOI 10.1109/CINTI.2016.7846382
[8]  
Fozo L, 2010, STUD COMPUT INTELL, V313, P313
[9]   Automated characterisation of subsurface defects by active IR thermographic testing - Discussion of step heating duration and defect depth determination [J].
Grys, S. ;
Minkina, W. ;
Vokorokos, L. .
INFRARED PHYSICS & TECHNOLOGY, 2015, 68 :84-91
[10]   Size determination of subsurface defect by active thermography - Simulation research [J].
Grys, S. ;
Vokorokos, L. ;
Borowik, L. .
INFRARED PHYSICS & TECHNOLOGY, 2014, 62 :147-153