III-V METAL-OXIDE-SEMICONDUCTOR TECHNOLOGY

被引:0
作者
Passlack, Matthias
机构
来源
2008 IEEE 20TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS (IPRM) | 2008年
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This short course on emerging III-V metal-oxide-semiconductor technology covers the following subjects. 1) Application spaces: RF power and CMOS. 2) The silicon CMOS perspective: performance gap beyond the 45 nm node, heterogeneous integration and III-V MOSFET challenges, III-V FET appeal. 3) Oxide/III-V semiconductor interface and surface chemistry. 4) Device concepts for high mobility channels: flatband-mode vs. inversion mode. 5) Electron mobilities in III-V MOSFET channels. 6) GaAs MOSFETs for RF power applications. 7) Proof of concept: InGaAs channel MOSFETs for CMOS applications. 8) Development strategy for non-silicon CMOS: materials proof of concept and volume manufacturing, devices proof of concept. 9) Alternative approaches: graphene channels, impact ionization MOS (i-MOS), interband tunneling MOSFET etc.
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页码:59 / 59
页数:1
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