Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits

被引：3

作者：

Sparkman, Brett ^{[1
]}

Smith, Scott C. ^{[2
]}

Di, Jia ^{[3
]}

机构：

[1] Univ Arkansas, Elect Engn, Fayetteville, AR 72701 USA

[2] Texas A&M Univ Kingsville, Elect Engn & Comp Sci, Kingsville, TX USA

[3] Univ Arkansas, Comp Sci & Comp Engn, Fayetteville, AR 72701 USA

来源：

2020 IEEE 38TH VLSI TEST SYMPOSIUM (VTS 2020) | 2020年

关键词：

Built-In Self-Test (BIST); asynchronous logic; NULL Convention Logic (NCL); Multi-Threshold NULL Convention Logic (MTNCL); Sleep Convention Logic (SCL);

D O I：

10.1109/vts48691.2020.9107627

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

While a number of methods exist for asynchronous circuit synthesis, there are limited applicable test methodologies. This paper presents a Built-In Self-Test (BIST) method for Multi-Threshold NULL Convention Logic (MTNCL) asynchronous circuits, which utilizes standard synchronous tools, and is automated to achieve maximum fault coverage while minimizing area overhead and test time.

引用

页数：6

共 9 条

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