Carbon nanotube as a probe for friction force microscopy

被引:22
作者
Ishikawa, M [1 ]
Yoshimura, M [1 ]
Ueda, K [1 ]
机构
[1] Toyota Technol Inst, Nano High Tech Resource Ctr, Tempaku Ku, Nagoya, Aichi 4688511, Japan
关键词
friction; nanoyubes; probe; AFM; SPM;
D O I
10.1016/S0921-4526(02)00973-0
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The carbon nanotube (CNT) probe, where a multi-walled CNT is attached onto a conventional cantilever of atomic force microscopy (AFM), is applied to study friction force on an atomic scale using friction force microscopy. Periodic hexagonal images corresponding to the atomic structure of the mica surface are successfully obtained using a short CNT of 50 nm length. The calculated spring constant across the axis of the CNT is comparable to the torsional spring constant of the AFM cantilever. This condition is crucial in imaging the surface with atomic resolution. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:184 / 186
页数:3
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