Effect of annealing temperature on micro-structural, optical and electrical characterization of nanostructured V2O5 thin films prepared by spray pyrolysis technique

被引：24

作者：

Gandasiri, Ravinder ^{[1
]}

Sreelatha, C. J. ^{[1
]}

Nagaraju, P. ^{[2
]}

Vijayakumar, Y. ^{[2
]}

机构：

[1] Kakatiya Univ, Dept Phys, Mat Res Lab, Warangal, Telangana, India

[2] Nanosensor Res Lab, Dept Phys, CMR Tech Campus, Hyderabad, Telangana, India

来源：

PHYSICA B-CONDENSED MATTER | 2019年 / 572卷

关键词：

V2O5; Triton-X; 100; Annealing temperature; Spray pyrolysis; PULSED-LASER DEPOSITION; ELECTROCHEMICAL PROPERTIES; GROWTH;

D O I：

10.1016/j.physb.2019.08.004

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

V2O5 thin films were deposited by the spray pyrolysis method on pre-cleaned glass substrates at 300 degrees C and also these thin films were annealed for 1 h from 350 degrees C to 450 degrees C. Ammonium vanadate (NH4VO3) and Triton X-100 were used as starting materials were dissolved in water solvent. Structural, Optical, morphological and electrical properties were analyzed by using X-ray diffraction (XRD), UV-Vis spectroscopy, scanning electron microscopy (SEM) and two probe method respectively. X-ray diffraction studies have shown the thin films were composed of V2O5 with orthorhombic structure and oriented along (100) direction at high annealing temperatures. The SEM images reveal the morphological changes in films while increase the annealing temperature. The effect of annealing temperature on optical and electrical properties of the V2O5 thin films have been investigated and reported.

引用

页码：220 / 224

页数：5

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