An 8-mW, ESD-protected, CMOS LNA for ultra-wideband applications

被引:8
作者
Bhatia, Karan [1 ]
Hyvonen, Sami [1 ]
Rosenbaum, Elyse [1 ]
机构
[1] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA
来源
PROCEEDINGS OF THE IEEE 2006 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2006年
关键词
D O I
10.1109/CICC.2006.320955
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A common-gate, 7.9mW, ESD-protected, CMOS Ultra-Wideband LNA is presented. A wideband transconductance enhancement scheme facilitates the inclusion of ESD protection at the circuit input and reduces noise figure. Measurement results indicate that the LNA achieves a high S-21 (15dB) over the entire band, and a 4.25kV HBM ESD protection level is projected from the measured failure current. Simulation results show low NF (34dB) across the band and an input-referred 1dB CP of -11.2dBm at 5GHz.
引用
收藏
页码:385 / 388
页数:4
相关论文
共 12 条
[1]  
ALLSTOT DJ, 2004, RAD FREQ INT CIRC RF, P97
[2]  
Amerasekera A., 2002, ESD SILICON INTEGRAT, V2nd
[3]  
Barth JE, 2001, IEEE T ELECTRON PA M, V24, P99, DOI 10.1109/6104.930960
[4]   An ultrawideband CMOS low-noise amplifier for 3.1-10.6-GHz wireless receivers [J].
Bevilacqua, A ;
Niknejad, AM .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2004, 39 (12) :2259-2268
[5]  
Chehrazi S, 2005, IEEE CUST INTEGR CIR, P801
[6]   A broadband low-noise front-end amplifier for ultra wideband in 0.13-μm CMOS [J].
Gharpurey, R .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2005, 40 (09) :1983-1986
[7]  
HYVONEN S, 2005, P EOS ESD S, P9
[8]  
Liao CF, 2005, IEEE CUST INTEGR CIR, P161
[9]  
Maloney T., 1985, P EOS ESD S, P49
[10]   Investigation on different ESD protection strategies devoted to 3.3 V RF applications (2 Ghz) in a 0.18um CMOS process [J].
Richier, C ;
Salome, P ;
Mabboux, G ;
Zaza, I ;
Juge, A ;
Mortini, P .
ELECTRICAL OVERSTRESS/ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 2000, 2000, :251-259