Investigation of optical properties of annealed aluminum phthalocyanine derivatives thin films

被引:10
作者
Sanchez-Vergara, M. E. [1 ]
Rivera, M. [2 ]
机构
[1] Univ Anahuac Mexico Norte, Fac Ingn, Huixquilucan 52786, Estado De Mexic, Mexico
[2] Univ Nacl Autonoma Mexico, Dpto Mat Condensada, Inst Fis, Mexico City 04510, DF, Mexico
关键词
Thin films; Electronic materials; Optical properties; COPPER-PHTHALOCYANINE; ABSORPTION; SEMICONDUCTOR; PARAMETERS; DISPERSION;
D O I
10.1016/j.jpcs.2014.01.006
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Semiconducting molecular materials based on aluminum phthalocyanine chloride (AlPcCl) and bidentate amines have been successfully used to prepare thin films by using a thermal evaporation technique. The morphology of the deposited films was studied by scanning electron microscopy (SEM) and atomic force microscopy (AFM). Studies of the optical properties were carried out on films deposited onto quartz and (1 0 0) monocrystalline silicon wafers and films annealed after deposition. The absorption spectra recorded in the UV-vis region for the as-deposited and annealed samples showed two absorption bands, namely the Q- and B-bands. In addition, an energy doublet in the absorption spectra of the monoclinic form at 1.81 and 1.99 eV was observed. A band-model theory was employed in order to determine the optical parameters. The fundamental energy gap (direct transitions) was determined to be within the 2.47-2.59 and 2.24-2.44 eV ranges, respectively, for the as-deposited and annealed thin films. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:599 / 605
页数:7
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