Prospects for Millimeter-Wave Compliance Measurement Technologies

被引：5

作者：

Alon, Leeor ^{[1
,2
]}

Gabriel, Sami ^{[3
]}

Cho, Gene Young ^{[4
,5
]}

Brown, Ryan ^{[5
]}

Deniz, Cem M. ^{[1
,2
]}

机构：

[1] NYU, Sch Med, Dept Radiol, New York, NY USA

[2] RF Test Labs, New York, NY USA

[3] Vodafone Grp, Res & Dev, Newbury, Berks, England

[4] Mem Sloan Kettering Canc Ctr, 1275 York Ave, New York, NY 10021 USA

[5] NYU, Sch Med, New York, NY USA

来源：

IEEE ANTENNAS AND PROPAGATION MAGAZINE | 2017年 / 59卷 / 02期

关键词：

ABSORPTION RATE MEASUREMENT; POWER-DENSITY; SYSTEM; MRI;

D O I：

10.1109/MAP.2017.2655530

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In recent years, there has been an increasing interest in millimeter-wave (mm-wave) technologies operating at frequencies between 10 and 300 GHz. mm-wave communication provides higher transfer rates that will be employed in the next-generation wireless networks. However, mm-wave device exposure compliance assessment is challenging due to a reduced wavelength and an increased number of antennas. In this article, we discuss physical features of future mm-wave communication networks and describe the requirements for proper exposure compliance assessment. Leading technologies that can be prospectively used for mm-wave exposure compliance are surveyed. Their pros and cons with respect to operating frequency, availability, sensitivity, and speed are discussed.

引用

页码：115 / 125

页数：11

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