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Modification of C60 thin films by ion irradiation
被引:4
|作者:
Narumi, K
[1
]
Naramoto, H
[1
]
机构:
[1] Japan Atom Energy Res Inst, Takasaki Branch, Adv Sci Res Ctr, Takasaki, Gumma 3701292, Japan
关键词:
C-60;
Si;
C;
ion irradiation;
thin films;
Raman scattering spectroscopy;
AFM;
polymerization;
D O I:
10.1016/S0257-8972(02)00278-5
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Transformation of C-60 thin films on Si(111) substrates by irradiation with 7-MeV C-12(2+) ions is investigated. Raman-spectroscopy analysis reveals that irradiation of C-60 films at low dose causes suppression of photopolymerization. The C-60 films are transformed into a form of amorphous carbon at high dose. Slight C-60 molecules still exist in the film up to the dose of 1.1 x 10(16)/cm(2). AFM analysis shows that as-prepared insulating films become conductive after irradiation up to the dose of 1.1 x 10(16)/cm(2), which results from conductive carbon species due to dissociation of the C-60 molecule. (C) 2002 Elsevier Science B.V. All rights reserved.
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页码:364 / 367
页数:4
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