Shadowing and absorption corrections of single-crystal high-pressure data

被引:105
作者
Katrusiak, A [1 ]
机构
[1] Adam Mickiewicz Univ Poznan, Fac Chem, PL-60780 Poznan, Poland
来源
ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 2004年 / 219卷 / 08期
关键词
high pressure; single crystal structure analysis; X-ray diffraction; absorption correction; shadowing correction; diamond-anvil cell;
D O I
10.1524/zkri.219.8.461.38328
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The effect of shadowing the sample crystal enclosed in the diamond-anvil high-pressure cell (DAC) by the gasket edges, i.e. by the walls of the high-pressure chamber, has been described for unrestricted data-collection procedures. A general vector formalism reveals new features of the shadowing and absorption corrections, depending on the primary beam-DAC-reflection configuration. The corrections apply to the data measured with conventional normal-beam-equatorial diffractometers, or with area-detectors. The simple vector approach optimizes computations and affords straightforward corrections of intensities. Feasibility of enhancing the resolution of numerical integration by applying fine grid divisions, has been discussed.
引用
收藏
页码:461 / 467
页数:7
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