Highly reliable nitride-based LEDs with internal ESD protection diodes

被引:13
作者
Chang, S. J. [1 ]
Shen, C. F.
Shei, S. C.
Chuang, R. W.
Chang, C. S.
Chen, W. S.
Ko, T. K.
Sheu, J. K.
机构
[1] Natl Cheng Kung Univ, Inst Microelect, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Dept Elect Engn, Adv Optoelect Technol Ctr, Tainan 70101, Taiwan
[3] Natl Univ Tainan, Dept Elect Engn, Tainan 700, Taiwan
[4] Epitech Technol Corp, Hsinshi 744, Taiwan
[5] Natl Cheng Kung Univ, Inst Electroopt Sci & Engn, Tainan 70101, Taiwan
关键词
current spreading; electrostatic-discharge (ESD); GaN; light-emitting diode (LED); protection diode;
D O I
10.1109/TDMR.2006.881454
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nitride-based light-emitting diodes (LEDs) with internal electrostatic-discharge (ESD) protection diodes emitting at 460 nm were proposed and realized. By building an internal GaN p-n junction diode, a negative ESD-induced pulse current is expected to flow through the protection diode without damaging the major LED. The ESD characteristic of the fabricated LEDs was obviously improved with this design. Furthermore, the dimension of the internal p-n diode would influence the capacity for tolerating the ESD stress. It was found that a negative ESD threshold could be significantly increased from 300-400 to 2000 V. On the other hand, the authors managed to bring down the 20-mA operation voltage to 3.29 V using the n-metal finger, which entails a good current spreading under operation as the result of a reduced current-crowding effect. Since a good current spreading beneficially alleviates the thermal effect under long-term operation, an effective pattern layout design clearly would also prolong the lifetime of the proposed LEDs.
引用
收藏
页码:442 / 447
页数:6
相关论文
共 18 条
[1]   Crystal growth and conductivity control of group III nitride semiconductors and their application to short wavelength light emitters [J].
Akasaki, I ;
Amano, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (9A) :5393-5408
[2]  
Chanard J, 2003, NEPHROLOGIE, V24, P3
[3]   Nitride-based, LEDs with MQW active region's grown by different temperature profiles [J].
Chang, SJ ;
Wei, SC ;
Su, YK ;
Chuang, RW ;
Chen, SM ;
Li, WL .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2005, 17 (09) :1806-1808
[4]   Nitride-based flip-chip ITO LEDs [J].
Chang, SJ ;
Chang, CS ;
Su, YK ;
Lee, CT ;
Chen, WS ;
Shen, CF ;
Hsu, YP ;
Shei, SC ;
Lo, HM .
IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2005, 28 (02) :273-277
[5]   Nitride-based LEDs with 800 °C grown p-AllnGaN-GaN double-cap layers [J].
Chang, SJ ;
Wu, LW ;
Su, YK ;
Hsu, YP ;
Lai, WC ;
Tsai, JA ;
Sheu, JK ;
Lee, CT .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2004, 16 (06) :1447-1449
[6]   Highly reliable nitride-based LEDs with SPS plus ITO upper contacts [J].
Chang, SJ ;
Chang, CS ;
Su, YK ;
Chuang, RW ;
Lin, YC ;
Shei, SC ;
Lo, HM ;
Lin, HY ;
Ke, JC .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 2003, 39 (11) :1439-1443
[7]   InGaN-GaN multiquantum-well blue and green light-emitting diodes [J].
Chang, SJ ;
Lai, WC ;
Su, YK ;
Chen, JF ;
Liu, CH ;
Liaw, UH .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2002, 8 (02) :278-283
[8]   400-nm InGaN-GaN and InGaN-AlGaN multiquantum well light-emitting diodes [J].
Chang, SJ ;
Kuo, CH ;
Su, YK ;
Wu, LW ;
Sheu, JK ;
Wen, TC ;
Lai, WC ;
Chen, JF ;
Tsai, JM .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2002, 8 (04) :744-748
[9]   Device and circuit modeling of GaN/InGaN light emitting diodes (LEDs) for optimum current spreading [J].
Ebong, A ;
Arthur, S ;
Downey, E ;
Cao, XA ;
LeBoeuf, S ;
Merfeld, DW .
SOLID-STATE ELECTRONICS, 2003, 47 (10) :1817-1823
[10]   Current crowding in GaN/InGaN light emitting diodes on insulating substrates [J].
Guo, X ;
Schubert, EF .
JOURNAL OF APPLIED PHYSICS, 2001, 90 (08) :4191-4195