Preparation and characterization of spray deposited n-type WO3 thin films for electrochromic devices

被引:132
作者
Sivakumar, R
Raj, AME
Subramanian, B
Jayachandran, M
Trivedi, DC
Sanjeeviraja, C [1 ]
机构
[1] Alagappa Univ, Dept Phys, Karaikkudi 630003, Tamil Nadu, India
[2] Scott Christian Coll, Dept Phys, Nagercoil 629003, Tamil Nadu, India
[3] Cent Electrochem Res Inst, Karaikkudi 630006, Tamil Nadu, India
关键词
thin films intercalation reactions; X-ray diffraction; electrochemical properties;
D O I
10.1016/j.materresbull.2004.04.023
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The n-type tungsten oxide (WO3) polycrystalline thin films have been prepared at an optimized substrate temperature of 250 degreesC by spray pyrolysis technique. Precursor solution of ammonium tungstate ((NH4)(2)WO4) was sprayed onto the well cleaned, pre-heated fluorine doped tin oxide coated (FTO) and glass substrates with a spray rate of 15 ml/min. The structural, surface morphological and optical properties of the as-deposited WO3 thin films were studied. Mott-Schottky (M-S) studies of WO3/FTO electrodes were conducted in Na2SO4 solution to identify their nature and extract semiconductor parameters. The electrochromic properties of the as-deposited and lithiated WO3/FTO thin films were analyzed by employing them as working electrodes in three electrode electrochemical cell using an electrolyte containing LiClO4 in propylene carbonate (PC) solution. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1479 / 1489
页数:11
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