Fabrication of gold nanowires using contact mode atomic force microscope

被引：4

作者：

Watanabe, M ^{[1
]}

Minoda, H ^{[1
]}

Takayanagi, K ^{[1
]}

机构：

[1] Tokyo Inst Technol, Phys Dept, Tokyo 1528551, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2004年 / 43卷 / 9A期

关键词：

AFM; contact mode; nanowires; gold; mica; applied force; fabrication;

D O I：

10.1143/JJAP.43.6347

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Gold nanowires were fabricated using a contact mode atomic force microscope (AFM), the tip of which scans a thin gold layer predeposited on a mica substrate. The nanowires are spaced with an interval in the range of 130-590 nm. Their widths and heights are distributed in the range of 70-110 nm and 4-7 nm, respectively. By adjusting the strength of the force applied by the AFM tip, the spacing, width and height of the nanowires can be controlled and made to increase as the applied force increases. Scanning an extensional area enabled us to fabricate long nanowires.

引用

页码：6347 / 6349

页数：3

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