Experience with silicon detectors at the DELPHI experiment, LEP

被引：5
|
作者：
Collins, P
机构：
[1] CERN
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1996年 / 383卷 / 01期
关键词：
D O I：
10.1016/S0168-9002(96)00623-7
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
New measurements are reported on modules of both the current DELPHI vertex detector, which was installed in 1994, and the upgraded detector which will be installed in 1996. These measurements include an analysis of the phenomenon of ''micro-discharge'' noise on the ohmic side of double sided detectors, an observation of variable depletion regions on double sided detectors, and the first test results for the 24 cm long back-to-back modules for the upgraded detector. For the detector presently in operation it has been possible to confirm measurements with tracks from the DELPHI data.
引用
收藏
页码：1 / 6
页数：6
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