Two-step numerical procedure for complex permittivity retrieval of dielectric materials from reflection measurements

被引：12

作者：

Hasar, Ugur Cem ^{[1
,2
]}

Barroso, Joaquim Jose ^{[3
]}

Kaya, Yunus ^{[4
]}

Ertugrul, Mehmet ^{[2
,5
]}

Bute, Musa ^{[1
]}

Catala-Civera, Jose M. ^{[6
]}

机构：

[1] Gaziantep Univ, Dept Elect & Elect Engn, TR-27310 Gaziantep, Turkey

[2] Ataturk Univ, Ctr Res & Applicat Nanosci & Nanoengn, TR-25240 Erzurum, Turkey

[3] Natl Inst Space Res, Associated Plasma Lab, BR-12227010 Sao Jose Dos Campos, SP, Brazil

[4] Bayburt Univ, Dept Elect & Energy, TR-69000 Bayburt, Turkey

[5] Ataturk Univ, Dept Elect & Elect Engn, TR-25240 Erzurum, Turkey

[6] Univ Politecn Valencia, Dept Commun, Valencia 46022, Spain

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2014年 / 116卷 / 04期

基金：

英国科研创新办公室;

关键词：

RESOLVING PHASE AMBIGUITY; ELECTRICAL-CONDUCTIVITY; METAMATERIAL PARAMETERS; CONTACTLESS MEASUREMENT; OPTICAL-CONSTANTS; TRANSMISSION-LINE; UNIQUE RETRIEVAL; INVERSE PROBLEM; PERMEABILITY; THICKNESS;

D O I：

10.1007/s00339-014-8303-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied to analyze on the complex reflection-coefficient plane the general pattern of dielectric behavior of the sample. Then, as a second step, optimization algorithms are utilized for retrieving electrical properties of samples. The procedure requires measurement of complex reflection scattering parameters of at least two samples with different lengths. It has been validated by X-band measurements of three polyvinyl chloride samples with lengths 5, 10, and 20 mm.

引用

页码：1701 / 1710

页数：10

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