Tandem triple-pass Fabry-Perot interferometer for applications in the near infrared

被引:3
|
作者
Gehrsitz, S
Sigg, H
Siegwart, H
Krieger, M
Heine, C
Morf, R
Reinhart, FK
Martin, W
Rudigier, H
机构
[1] Institute of Micro and Optoelectronics, Swiss Federal Institute of Technology (EPFL), Lausanne
[2] Balzers AG, Thin Film Components, Balzers
[3] Paul Scherrer Institute Zurich, Zurich, CH-8048
[4] ESEC SA, Cham, CH-6330
来源
APPLIED OPTICS | 1997年 / 36卷 / 22期
关键词
Fabry-Perot interferometer; multipassing; broadband dielectric mirrors; near-infrared Brillouin scattering; vertical cavity surface-emitting laser;
D O I
10.1364/AO.36.005355
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A standard tandem triple-pass scanning Fabry-Perot interferometer of the Vernier type for applications in the near infrared is described. The Fabry-Perot etalons have been coated with a specially designed dielectric multilayer stack with low loss factors and a uniform reflectivity of(92.5 +/- 1.0)% between 730 and 860 nm. The performances of the instrument, such as resolution, total transmission and contrast, are equivalent to conventional tandem Fabry-Perot spectrometers but over the whole near-infrared wavelength range. Applications of the system to Brillouin scattering on semiconductors in the transparent wavelength regime and high-resolution spectroscopy of vertical cavity surface-emitting lasers are given. (C) 1997 Optical Society of America.
引用
收藏
页码:5355 / 5361
页数:7
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