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First-principles molecular-dynamics calculations and STM observations of dissociative adsorption of Cl2 and F2 on Si(001) surface
被引:17
|作者:
Okada, H
Inagaki, K
Goto, H
Endo, K
Hirose, K
Mori, Y
机构:
[1] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, Suita, Osaka 5650871, Japan
[2] Kyoto Inst Technol, Fac Engn & Design, Dept Mech & Syst Engn, Sakyo Ku, Kyoto 6068585, Japan
关键词:
computer simulations;
density functional calculations;
models of surface chemical reactions;
molecular dynamics;
chemisorption;
silicon;
chlorine;
halogens;
D O I:
10.1016/S0039-6028(02)01776-4
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
We have studied the dissociative adsorption process of halogen Molecules (Cl-2 and F-2) on the Si(0 0 1) surface by first-principles molecular-dynamics (FPMD) calculations and scanning tunneling microscopy (STM) observations. From FPMD calculations, we demonstrate that Cl-2 and F-2 molecules adsorb dissociatively at dangling bonds of a buckled dimer with no energy barrier, so that the buckled dimer becomes geometrically flat. In addition, STM observations show that the dissociative adsorptions Of Cl-2 and F-2 induce buckled dimers at the SA step on the Si(0 0 1)-(2 x 1) surface to become symmetric dimers, in good agreement with the results of FPMD calculations. (C) 2002 Elsevier Science B.V. All rights reserved.
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页码:287 / 295
页数:9
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