Effect of Substrate Properties on Nanostructure and Optical Properties of CdTe Thin Films

被引:16
作者
Hasani, Ebrahim [1 ]
Kamalian, Monir [1 ]
Arashti, Maryam Gholizadeh [1 ]
Habashi, Lida Babazadeh [1 ]
机构
[1] Islamic Azad Univ, Dept Phys, Yadegar E Imam Khomeini RAH Shahre Rey Branch, Tehran, Iran
关键词
Cadmium telluride; transparent conducting films; texture coefficient; optical band gap; extinction coefficient; residual stress; SOLAR-CELL; PHYSICAL-PROPERTIES; VACUUM EVAPORATION; TEMPERATURE; CONSTANTS; DEPOSITION; TRANSPORT;
D O I
10.1007/s11664-019-07204-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cadmium telluride (CdTe) nanoparticles were deposited on amorphous glass and crystal quartz as nonconductive films, indium tin oxide and fluorine doped tin oxide as transparent conducting films, and silver as a metal at 100 degrees C under pressure of 2x10(-5)mbar. CdTe thin films prepared by a thickness about 80nm. The results of x-ray diffraction analysis show the grain size of preferential orientation was between 5.48nm and 15.37nm. Also, the preferential orientation changed from (111) for non-conducting substrates to (220) for conducting substrates. The investigation of texture coefficient (T-C) has indicated the deviation of T-C from unity for metals substrates is further than the other substrates. The optical properties of CdTe thin films such as the optical band gap, extinction coefficient and refractive index, real and imaginary parts of dielectric constant were investigated by ultraviolet-visible spectroscopy (UV-Vis) as a function of photon energy in the wavelength range of 600-1600nm. These measurements indicated the increasing of optical band gap by increasing the conductivity of substrates. Scanning electron microscopy analysis used to investigate the morphology of thin films.
引用
收藏
页码:4283 / 4292
页数:10
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