RADIATION HARDNESS STUDIES OF PIN-DIODE DETECTORS IRRADIATED WITH HEAVY IONS

被引:1
作者
Krutul, K. [1 ,2 ]
Napiorkowski, P. J. [2 ]
Hadynska-Klek, K. [2 ]
Wrzosek-Lipska, K. [2 ]
Komorowska, M. [2 ]
Paluch-Ferszt, M. [2 ]
Szeflinski, Z. [2 ]
Horodek, P. [3 ]
Olejniczak, A. [4 ,5 ]
Skuratov, V. A. [5 ,6 ,7 ]
机构
[1] Univ Bialystok, Bialystok, Poland
[2] Univ Warsaw, Heavy Ion Lab, Warsaw, Poland
[3] Polish Acad Sci, Inst Nucl Phys, Krakow, Poland
[4] Nicolaus Copernicus Univ, Torun, Poland
[5] Joint Inst Nucl Res, Dubna, Russia
[6] Natl Res Nucl Univ MEPhI, Moscow, Russia
[7] Dubna State Univ, Dubna, Russia
关键词
POSITRON-ANNIHILATION;
D O I
10.5506/APhysPolBSupp.13.861
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Evaluation of the properties of a set of PIN-diode-type semiconductor detectors was performed at the Heavy Ion Laboratory University of Warsaw in Poland with the a particles from Am-241. In order to monitor the radiation damage process in a controlled conditions, the in-beam irradiation experiments were performed using heavy-ion beams: C-12 and Ne-20 at HIL in Warsaw, and Xe-132 at JINR in Dubna. The properties of the irradiated PIN-diode detectors were tested using the positron annihilation spectroscopy. The preliminary results of the experiments are presented.
引用
收藏
页码:861 / 867
页数:7
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