A compact electron beam ion source with integrated Wien filter providing mass and charge state separated beams of highly charged ions

被引：37
作者：
Schmidt, M. [1 ]
Peng, H. [2 ]
Zschornack, G. [3 ]
Sykora, S. [4 ]
机构：
[1] DREEBIT GmbH, D-01109 Dresden, Germany
[2] Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 730000, Peoples R China
[3] Tech Univ Dresden, Inst Angew Phys, D-01062 Dresden, Germany
[4] Tech Univ Dresden, Inst Theoret Phys, D-01062 Dresden, Germany
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2009年 / 80卷 / 06期
基金：
中国国家自然科学基金;
关键词：
electron beams; ion sources; permanent magnets; xenon; TRAP;
D O I：
10.1063/1.3125628
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A Wien filter was designed for and tested with a room temperature electron beam ion source (EBIS). Xenon charge state spectra up to the charge state Xe(46+) were resolved as well as the isotopes of krypton using apertures of different sizes. The complete setup consisting of an EBIS and a Wien filter has a length of less than 1 m substituting a complete classical beamline setup. The Wien filter is equipped with removable permanent magnets. Hence total beam current measurements are possible via simple removal of the permanent magnets. In dependence on the needs of resolution a weak (0.2 T) or a strong (0.5 T) magnets setup can be used. In this paper the principle of operation and the design of the Wien filter meeting the requirements of an EBIS are briefly discussed. The first ion beam extraction and separation experiments with a Dresden EBIS are presented.
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页数：6
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