Transmission electron microscopic study of grain boundaries in (Bi,Pb)(2)Sr2Ca2Cu3Ox silver-sheathed tapes

被引：2
|
作者：
Grindatto, DP [1 ]
Hensel, B [1 ]
Grasso, G [1 ]
Nissen, HU [1 ]
Flukiger, R [1 ]
机构：
[1] UNIV GENEVA,DEPT PHYS MAT CONDENSEE,CH-1211 GENEVA 4,SWITZERLAND
来源：
PHYSICA C | 1997年 / 282卷
关键词：
D O I：
10.1016/S0921-4534(97)01422-6
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The grain boundaries in high-j(c) (Bi,Pb)(2)Sr2Ca2Cu3Ox silver-sheathed tapes have been investigated using transmission electron microscopy (TEM). Two basic types of boundaries have been observed. Both types permit the outstanding supercurrent transport over macroscopic distances. The observed grain boundaries are found to not be accompanied by amorphous material and intergranular phases, even when they are totally incoherent.
引用
收藏
页码：2571 / 2572
页数：2
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