"Torsional tapping" atomic force microscopy using T-shaped cantilevers

被引：13

作者：

Mullin, Nic ^{[1
]}

Vasilev, Cvetelin ^{[2
]}

Tucker, Jaimey D. ^{[2
]}

Hunter, C. Neil ^{[2
]}

Weber, Christa H. M. ^{[3
]}

Hobbs, Jamie K. ^{[1
,3
]}

机构：

[1] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England

[2] Univ Sheffield, Dept Mol Biol & Biotechnol, Sheffield S10 2TN, S Yorkshire, England

[3] Univ Sheffield, Dept Chem, Sheffield S3 7HF, S Yorkshire, England

来源：

APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 17期

关键词：

atomic force microscopy; cantilevers; Q-factor; SPEED; AFM;

D O I：

10.1063/1.3126047

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Torsional oscillation of atomic force microscope cantilevers has been shown to offer increased optical lever sensitivity, quality factor, resonant frequency, and stiffness as compared to flexural oscillation. In this letter, T-shaped cantilevers are oscillated torsionally to give a tapping motion at the tip. This gives many of the advantages of small cantilevers, without the requirement for specialized detection optics. In order to demonstrate the capability of this technique, high resolution images of LH2 membrane protein crystal structures are presented. Reduced settle time and tip-sample force under error signal are also demonstrated.

引用

页数：3

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