The frequency noise and spectral linewidth in semiconductor ring lasers

Numerical analyses for power spectral density of frequency noise (FN) and spectral linewidth in monolithic semiconductor ring laser (SRL) operating in the bistable unidirectional regime are performed in this paper. The Langevin noise sources for electric field and carrier density fluctuations are also taken into account in the frequency-domain theoretical model. The influences of several important physical parameters on the FN properties and laser linewidth are clearly demonstrated, including the injection current, linewidth enhancement factor and the particular backscattering coefficient. Due to the particular backscattering in SRLs, the calculated linewidths are relatively higher than that from the conventional Henry formula. The laser linewidth shows an exponential relationship with the backscattering strength.