Characterizing acid diffusion lengths in chemically amplified resists from measurements of deprotection kinetics

被引:7
作者
Patil, Abhijit A. [1 ]
Pandey, Yogendra Narayan [1 ]
Doxastakis, Manolis [2 ]
Stein, Gila E. [1 ]
机构
[1] Univ Houston, Dept Chem & Biomol Engn, Houston, TX 77204 USA
[2] Argonne Natl Lab, Inst Mol Engn, Argonne, IL 60439 USA
来源
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | 2014年 / 13卷 / 04期
基金
美国国家科学基金会;
关键词
photoresist; stochastic simulations; chemical amplification; lithography; anomalous kinetics; acid trapping; reaction-diffusion; poly(4-hydroxystyrene-co-tertbutyl acrylate); nonisothermal kinetics; subdiffusive transport; GLASS-TRANSITION TEMPERATURE; ANOMALOUS DIFFUSION; POLYMER-FILMS; PROBE; PHOTORESISTS; LITHOGRAPHY; CONFINEMENT; MODELS; FRONT; THIN;
D O I
10.1117/1.JMM.13.4.043017
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The acid-catalyzed deprotection of glassy poly(4-hydroxystyrene-co-tertbutyl acrylate) films was studied with infrared absorbance spectroscopy and stochastic simulations. Experimental data were interpreted with a simple description of subdiffusive acid transport coupled to second-order acid loss. This model predicts key attributes of observed deprotection rates, such as fast reaction at short times, slow reaction at long times, and a nonlinear dependence on acid loading. Fickian diffusion is approached by increasing the postexposure bake temperature or adding plasticizing agents to the polymer resin. These findings demonstrate that acid mobility and overall deprotection kinetics are coupled to glassy matrix dynamics. To complement the analysis of bulk kinetics, acid diffusion lengths were calculated from the anomalous transport model and compared with nano-pattern line widths. The consistent scaling between experiments and simulations suggests that the anomalous diffusion model could be further developed into a predictive lithography tool. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:7
相关论文
共 29 条
[1]   DERIVATION OF THE KOHLRAUSCH-WILLIAMS WATTS DECAY LAW FROM ACTIVATION-ENERGY DISPERSION [J].
BENDLER, JT ;
SHLESINGER, MF .
MACROMOLECULES, 1985, 18 (03) :591-592
[2]   Improved chemically amplified photoresist characterization using interdigitated electrode sensors: Photoacid diffusivity measurements [J].
Berger, CM ;
Henderson, CL .
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXI, PTS 1 AND 2, 2004, 5376 :392-403
[3]   Super-resolution Optical Measurement of Nanoscale Photoacid Distribution in Lithographic Materials [J].
Berro, Adam J. ;
Berglund, Andrew J. ;
Carmichael, Peter T. ;
Kim, Jong-Seung ;
Liddle, J. Alexander .
ACS NANO, 2012, 6 (11) :9496-9502
[4]   PROXIMITY EFFECT IN ELECTRON-BEAM LITHOGRAPHY [J].
CHANG, THP .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06) :1271-1275
[5]   ANOMALOUS DIFFUSION OF PROBE MOLECULES IN POLYSTYRENE - EVIDENCE FOR SPATIALLY HETEROGENEOUS SEGMENTAL DYNAMICS [J].
CICERONE, MT ;
BLACKBURN, FR ;
EDIGER, MD .
MACROMOLECULES, 1995, 28 (24) :8224-8232
[6]   Moving boundary transport model for acid diffusion in chemically amplified resists [J].
Croffie, E ;
Cheng, MS ;
Neureuther, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06) :3339-3344
[7]   Scaling of Tg and reaction rate with film thickness in photoresist:: A thermal probe study [J].
Fryer, DS ;
Nealey, PF ;
de Pablo, JJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (06) :3376-3380
[8]   Study of acid diffusion in resist near the glass transition temperature [J].
Fryer, DS ;
Bollepali, S ;
de Pablo, JJ ;
Nealey, PF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06) :3351-3355
[9]   Confinement effects on the spatial extent of the reaction front in ultrathin chemically amplified photoresists [J].
Goldfarb, DL ;
Angelopoulos, M ;
Lin, EK ;
Jones, RL ;
Soles, CL ;
Lenhart, JL ;
Wu, WL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (06) :2699-2704
[10]   Small molecule probe diffusion in thin and ultrathin supported polymer films [J].
Hall, DB ;
Torkelson, JM .
MACROMOLECULES, 1998, 31 (25) :8817-8825