共 29 条
[2]
Improved chemically amplified photoresist characterization using interdigitated electrode sensors: Photoacid diffusivity measurements
[J].
ADVANCES IN RESIST TECHNOLOGY AND PROCESSING XXI, PTS 1 AND 2,
2004, 5376
:392-403
[4]
PROXIMITY EFFECT IN ELECTRON-BEAM LITHOGRAPHY
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1975, 12 (06)
:1271-1275
[6]
Moving boundary transport model for acid diffusion in chemically amplified resists
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1999, 17 (06)
:3339-3344
[7]
Scaling of Tg and reaction rate with film thickness in photoresist:: A thermal probe study
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2000, 18 (06)
:3376-3380
[8]
Study of acid diffusion in resist near the glass transition temperature
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1999, 17 (06)
:3351-3355
[9]
Confinement effects on the spatial extent of the reaction front in ultrathin chemically amplified photoresists
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2001, 19 (06)
:2699-2704