PDN Impedance Modeling of 3D System-in-Package

被引:0
|
作者
Oizono, Yoshiaki [1 ]
Nabeshima, Yoshitaka [1 ]
Okumura, Takafumi [1 ]
Sudo, Toshio [1 ]
Sakai, Atsushi [2 ]
Ikeda, Hiroaki [2 ]
机构
[1] Shibaura Inst Technol, Koto Ku, 3-7-5 Toyosu, Tokyo, Japan
[2] Assoc Super Adv Elect Technol, Chuo Ku, Tokyo, Japan
来源
2011 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS SYMPOSIUM (EDAPS) | 2011年
关键词
SILICON; TSV; DESIGN;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Power supply impedance of power distribution network (PDN) for a 3D system-in-package (SiP) has been investigated. The 3D SiP consisted of 3 stacked chips and an organic package substrate. These three chips were a memory chip on the top, Si interposer in the middle, and a logic chip on the bottom. The size of each chip was the same, and 9.93 mm by 9.93 mm. A large number of through silicon vias (TSV's) were formed to the silicon interposer and the logic chip. Next, the 3 stacked chips were assembled on the organic package substrate, whose size was 26 mm by 26 mm. The PDN impedance for each chip was extracted by using XcitePI (Sigrity Inc.). Then, the PDN impedance for the organic package substrate was extracted by using SIwave (Ansys Inc.). Finally, the total PDN impedance was synthesized. In this paper, the PDN impedances of the memory chip, Si interposer, and the logic chip were calculated respectively, and then the total PDN impedance was synthesized to estimate the power supply disturbance due to the anti-resonance peak.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Design and process of 3D MEMS system-in-package (SiP)
    Lau J.H.
    Journal of Microelectronics and Electronic Packaging, 2010, 7 (01): : 10 - 15
  • [2] PDN Impedance and Noise Simulation of 3D SiP with a Widebus Structure
    Takatani, Hiroki
    Tanaka, Yosuke
    Oizono, Yoshiaki
    Nabeshima, Yoshitaka
    Okumura, Takafumi
    Sudo, Toshio
    Sakai, Atsushi
    Uchiyama, Shiro
    Ikeda, Hiroaki
    2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2012, : 673 - 677
  • [3] Correlation of PDN Impedance between Measurements and Simulation of 3D-SiP
    Kawaguchi, Shohei
    Sato, Masaomi
    Takatani, Hiroki
    Tanaka, Yosuke
    Fujita, Haruya
    Suto, Yoichi
    Sudo, Toshio
    2013 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS SYMPOSIUM (EDAPS), 2013, : 158 - 161
  • [4] Eight-Port Metamaterial Loaded UWB-MIMO Antenna System for 3D System-in-Package Applications
    Shabbir, Tayyab
    Saleem, Rashid
    Al-Bawri, Samir Salem
    Shafique, Muhammad Farhan
    Islam, Mohammad Tariqul
    IEEE ACCESS, 2020, 8 : 106982 - 106992
  • [5] Modeling and Analysis of PDN Impedance and Switching Noise in TSV-Based 3-D Integration
    He, Huanyu
    Lu, James Jian-Qiang
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 62 (04) : 1241 - 1247
  • [6] Novel 3-D Coaxial Interconnect System for Use in System-in-Package Applications
    LaMeres, Brock J.
    McIntosh, Christopher
    Abusultan, Monther
    IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2010, 33 (01): : 37 - 47
  • [7] The Most Cost-Effective Integrator (TSV Interposer) for 3D IC Integration System-in-Package (SiP)
    Lau, John H.
    PROCEEDINGS OF THE ASME PACIFIC RIM TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC SYSTEMS, MEMS AND NEMS 2011, VOL 1, 2012, : 53 - 63
  • [8] Modeling and Analysis of Package PDN for Computing System based on Cavity Model
    Cho, Jonghyun
    Bai, Siqi
    Zhao, Biyao
    Ruehli, Albert
    Drewniak, James
    Cocchini, Matteo
    Connor, Samuel
    Cracraft, Michael A.
    Becker, Dale
    2017 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & SIGNAL/POWER INTEGRITY (EMCSI), 2017, : 213 - 218
  • [9] TSV Modeling and Thermal Analysis Based on 3D Package
    Tian Wenchao
    Wang Wenlong
    Wang Hongming
    2012 13TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2012), 2012, : 545 - 547
  • [10] New System-in-Package (SiP) Integration Technologies
    Yu, Doug C. H.
    2014 IEEE PROCEEDINGS OF THE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2014,