Quantum confinement in Si and Ge nanostructures: Theory and experiment

被引:183
作者
Barbagiovanni, Eric G. [1 ]
Lockwood, David J. [2 ]
Simpson, Peter J. [3 ]
Goncharova, Lyudmila V. [3 ]
机构
[1] Beijing Computat Sci Res Ctr, Lab Simulat Phys Syst, Beijing 100084, Peoples R China
[2] CNR, Ottawa, ON K1A 0R6, Canada
[3] Univ Western Ontario, Dept Phys & Astron, London, ON N6A 3K7, Canada
来源
APPLIED PHYSICS REVIEWS | 2014年 / 1卷 / 01期
关键词
MOLECULAR-BEAM EPITAXY; NEAR-INFRARED PHOTOLUMINESCENCE; EFFECTIVE-MASS APPROXIMATION; VISIBLE-LIGHT EMISSION; OXIDE-ASSISTED GROWTH; OPTICAL-PROPERTIES; SILICON NANOCRYSTALS; BAND-GAP; ELECTRONIC-STRUCTURE; POROUS SILICON;
D O I
10.1063/1.4835095
中图分类号
O59 [应用物理学];
学科分类号
摘要
The role of quantum confinement (QC) in Si and Ge nanostructures (NSs) including quantum dots, quantum wires, and quantum wells is assessed under a wide variety of fabrication methods in terms of both their structural and optical properties. Structural properties include interface states, defect states in a matrix material, and stress, all of which alter the electronic states and hence the measured optical properties. We demonstrate how variations in the fabrication method lead to differences in the NS properties, where the most relevant parameters for each type of fabrication method are highlighted. Si embedded in, or layered between, SiO2, and the role of the sub-oxide interface states embodies much of the discussion. Other matrix materials include Si3N4 and Al2O3. Si NSs exhibit a complicated optical spectrum, because the coupling between the interface states and the confined carriers manifests with varying magnitude depending on the dimension of confinement. Ge NSs do not produce well-defined luminescence due to confined carriers, because of the strong influence from oxygen vacancy defect states. Variations in Si and Ge NS properties are considered in terms of different theoretical models of QC (effective mass approximation, tight binding method, and pseudopotential method). For each theoretical model, we discuss the treatment of the relevant experimental parameters. (C) 2014 AIP Publishing LLC.
引用
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页数:47
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