Propagator theory of scanning tunneling microscopy

被引:18
作者
Bracher, C
Riza, M
Kleber, M
机构
[1] Physik-Department T30, Technische Universität München, 85747 Garching, James-Franck-Strasse
来源
PHYSICAL REVIEW B | 1997年 / 56卷 / 12期
关键词
D O I
10.1103/PhysRevB.56.7704
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We develop a quantum mechanical scattering theory for electrons which tunnel out of (or into) the tip of a scanning tunneling microscope. The method is based on propagators (or Green functions) for quasistationary scattering with the tip being an electron source (or sink). The results for the tunneling current generalize the Tersoff-Hamann approach of scanning tunneling microscopy. In contrast to previous calculations the present theory relates the tunneling current to the potential distribution of the sample. Expressions for the corrugation are available through a simple perturbation expansion scheme. Analytical model calculations are presented and compared with existing results.
引用
收藏
页码:7704 / 7715
页数:12
相关论文
共 50 条
  • [11] Theory of scanning tunneling microscopy of defects on semiconductor surfaces
    de la Broïse, X
    Delerue, C
    Lannoo, M
    Grandidier, B
    Stiévenard, D
    PHYSICAL REVIEW B, 2000, 61 (03): : 2138 - 2145
  • [12] MOLECULAR-ORBITAL THEORY FOR THE SCANNING TUNNELING MICROSCOPY
    OHNISHI, S
    TSUKADA, M
    SOLID STATE COMMUNICATIONS, 1989, 71 (05) : 391 - 394
  • [13] THEORY OF ELECTRON-TUNNELING IN SCANNING-TUNNELING-MICROSCOPY AND FIELD-ION MICROSCOPY
    TSUKADA, M
    APPLIED SURFACE SCIENCE, 1994, 76 (1-4) : 312 - 321
  • [14] THEORY OF TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT IN SCANNING TUNNELING MICROSCOPY
    CIRACI, S
    TEKMAN, E
    PHYSICAL REVIEW B, 1989, 40 (17): : 11969 - 11972
  • [15] SCANNING TUNNELING MICROSCOPY
    ELINGS, V
    AMERICAN LABORATORY, 1988, 20 (04) : 124 - 124
  • [16] SCANNING TUNNELING MICROSCOPY
    SHEN, J
    PRITCHARD, RG
    THURSTANS, RE
    CONTEMPORARY PHYSICS, 1991, 32 (01) : 11 - 20
  • [17] SCANNING TUNNELING MICROSCOPY
    SAKURAI, T
    SAKAI, A
    DENKI KAGAKU, 1988, 56 (08): : 601 - 607
  • [18] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) : 355 - 369
  • [19] SCANNING TUNNELING MICROSCOPY
    STOLL, E
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1984, 9 (03): : 213 - 216
  • [20] SCANNING TUNNELING MICROSCOPY
    NISHIKAWA, O
    JOURNAL OF ELECTRON MICROSCOPY, 1988, 37 (02): : 92 - 93