All-Solution-Processed Inverted Quantum-Dot Light-Emitting Diodes

被引:95
|
作者
Castan, Alice [1 ]
Kim, Hyo-Min [1 ]
Jang, Jin [1 ]
机构
[1] Kyung Hee Univ, Adv Display Res Ctr, Dept Informat Display, Seoul 130701, South Korea
关键词
all-solution-process; inverted structure; polyoxyethylene tridecyl ether; QLED; quantum dot; ALUMINUM-ZINC-OXIDE; DEVICES;
D O I
10.1021/am404876p
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Quantum dots are a promising new candidate for the emissive material in light-emitting devices for display applications. The fabrication of such devices by solution processing allows considerable cost reduction and is therefore very attractive for industrial manufacturers. We report all solution-processed colloidal quantum-dot light-emitting diodes (QLEDs) with an inverted structure. The red, green, and blue devices showed maximum luminances of 12510, 32 370, and 249 cd/m(2) and turn-on voltages of 2.8, 3.6, and 3.6 V, respectively. We investigate the effect of a surfactant addition in the hole injection layer (HIL), with the aim of facilitating layer deposition and thereby enhancing device performance. We demonstrate that in the device structure presented in this study, a small amount of surfactant in the HIL can significantly improve the performance of the QLED.
引用
收藏
页码:2508 / 2515
页数:8
相关论文
共 50 条
  • [21] Solution-processed green and blue quantum-dot light-emitting diodes with eliminated charge leakage
    Deng, Yunzhou
    Peng, Feng
    Lu, Yao
    Zhu, Xitong
    Jin, Wangxiao
    Qiu, Jing
    Dong, Jiawei
    Hao, Yanlei
    Di, Dawei
    Gao, Yuan
    Sun, Tulai
    Zhang, Ming
    Liu, Feng
    Wang, Linjun
    Ying, Lei
    Huang, Fei
    Jin, Yizheng
    NATURE PHOTONICS, 2022, 16 (07) : 505 - +
  • [22] Stable and efficient quantum-dot light-emitting diodes based on solution-processed multilayer structures
    Qian, Lei
    Zheng, Ying
    Xue, Jiangeng
    Holloway, Paul H.
    NATURE PHOTONICS, 2011, 5 (09) : 543 - 548
  • [23] On the degradation mechanisms of quantum-dot light-emitting diodes
    Chen, Song
    Cao, Weiran
    Liu, Taili
    Tsang, Sai-Wing
    Yang, Yixing
    Yan, Xiaolin
    Qian, Lei
    NATURE COMMUNICATIONS, 2019, 10 (1)
  • [24] All-Solution-Processed Quantum Dot Light-Emitting Diode Using Phosphomolybdic Acid as Hole Injection Layer
    Hwang, Jeong Ha
    Seo, Eunyong
    Park, Sangwook
    Lee, Kyungjae
    Kim, Dong Hyun
    Lee, Seok Hyoung
    Kwon, Yong Woo
    Roh, Jeongkyun
    Lim, Jaehoon
    Lee, Donggu
    MATERIALS, 2023, 16 (04)
  • [25] Tunneling effect in quantum-dot light-emitting diodes
    Yu, Rongmei
    Cheng, Jinbing
    Lu, Yingying
    Pu, Chunying
    Wang, Ting
    Ji, Wenyu
    APPLIED PHYSICS LETTERS, 2025, 126 (01)
  • [26] Effect of Postannealing on Quantum-Dot Light-Emitting Diodes
    Hou, Wenjun
    Wang, Tianfeng
    Guo, Yulin
    Liang, Wenlin
    Wu, Longjia
    Cao, Weiran
    Lin, Xiongfeng
    ACS APPLIED OPTICAL MATERIALS, 2024, 2 (03): : 368 - 372
  • [27] All-solution processed quantum dot light-emitting diodes with low turn-on voltage
    Cao Li-juan
    Jiang Cong-biao
    Luo Yu
    Li Miao-zi
    Li Jia-li
    Cun Yang-ke
    Wang Jian
    Peng Jun-biao
    Cao Yong
    CHINESE JOURNAL OF LIQUID CRYSTALS AND DISPLAYS, 2020, 35 (08) : 785 - 794
  • [28] Highly-efficient and all-solution-processed red-emitting InP/ZnS-based quantum-dot light-emitting diodes enabled by compositional engineering of electron transport layers
    Chen, Fei
    Lv, Peiwen
    Li, Xu
    Deng, Zhenbo
    Teng, Feng
    Tang, Aiwei
    JOURNAL OF MATERIALS CHEMISTRY C, 2019, 7 (25) : 7636 - 7642
  • [29] Solution-Processed Double-Junction Quantum-Dot Light-Emitting Diodes with an EQE of Over 40%
    Shen, Piaoyang
    Cao, Fan
    Wang, Haoran
    Wei, Bin
    Wang, Feijiu
    Sun, Xiao Wei
    Yang, Xuyong
    ACS APPLIED MATERIALS & INTERFACES, 2019, 11 (01) : 1065 - 1070
  • [30] Solution-processed vanadium oxide as an efficient hole injection layer for quantum-dot light-emitting diodes
    Zhang, Heng
    Wang, Siting
    Sun, Xiaowei
    Chen, Shuming
    JOURNAL OF MATERIALS CHEMISTRY C, 2017, 5 (04) : 817 - 823