A ± 3 ppm/°C Single-Trim Switched Capacitor Bandgap Reference for Battery Monitoring Applications

被引:31
作者
Hunter, Bradford L. [1 ]
Matthews, Wallace E. [1 ]
机构
[1] Texas Instruments Inc, Austin, TX 78733 USA
关键词
Bandgap reference; delta-sigma conversion; battery monitor; room temperature trim; switched capacitor; 3-SIGMA INACCURACY; VOLTAGE REFERENCE; CMOS;
D O I
10.1109/TCSI.2016.2621725
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A precision bandgap reference has been developed in a 0.18 mu m BiCMOS process that achieves +/- 3 ppm/degrees C temperature drift at +/- 3 sigma from -40 degrees C to 110 degrees C. The reference is designed to utilize single temperature trim and standard components. A 3.65 V switched capacitor reference voltage is provided to a 2nd order delta-sigma modulator ADC to digitize a battery cell voltage. The switched capacitor reference utilizes fully differential sampling which reduces the errors from channel charge injection and clock feedthrough introduced by pseudodifferential sampling. A new technique for sampling a V-be voltage directly onto the output of the reference's differential amplifier has been developed that removes the error that would be introduced from differentially sampling the V-be and the Delta V-be voltage terms independently. The bandgap reference and ADC combination have an input referred noise spectral density of 4.7 mu V/ root Hz from 0.1 to 162 Hz yielding 15 stable output bits.
引用
收藏
页码:777 / 786
页数:10
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